By Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty
This booklet will introduce new recommendations for detecting and diagnosing small-delay defects in built-in circuits. even if this kind of timing disorder is usually present in built-in circuits synthetic with nanometer expertise, it will be the 1st publication to introduce potent and scalable methodologies for screening and diagnosing small-delay defects, together with very important parameters resembling procedure adaptations, crosstalk, and tool provide noise.
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Extra resources for Test and Diagnosis for Small-Delay Defects
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